Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...

Piezoresponse force microscopy (PFM) is an effective method for examining ferroelectric materials due to its nanometer-level resolution and high sensitivity, inherited from atomic force microscopy ...

Researchers have discovered that ferroelectric fluids can harness an overlooked transverse electrostatic force (TEF) to rise over 80 mm, without magnets or high voltages. By exploiting the fluid's ...