AI and citizen science reveal potential first detection of invasive malaria mosquito in Madagascar

Researchers from the University of South Florida have used artificial intelligence and citizen science to identify what may ...
Semiconductor Engineering

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...