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Researchers have successfully demonstrated a spectrometer that is orders of magnitude smaller than current technologies and can accurately measure wavelengths of light from ultraviolet to the ...
The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for ...
Fig. 2. AOIs of the Space Raman Spectrometer (A, Space Raman Spectrometer; B, power indicator; C, cleaning interface; D, liquid inlet interface; E, power interface; F ...
Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...
IIIF provides researchers rich metadata and media viewing options for comparison of works across cultural heritage collections. Visit the IIIF page to learn more. This is a photometer head assembly ...
The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV ...
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